Integrated Circuit Test Engineering: Modern Techniques ( 199 views )
Integrated Circuit Test Engineering: Modern Techniques
By Ian A. Grout
Publisher: Springer ( 2005-10-21 ) | 362 pages | ISBN : 1846280230 | PDF | 5 MB
Nearly sixty years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous test engineering activities during development and production. Test engineering must also be more closely interwoven with microelectronic design. An understanding of circuit test engineering is vital to any student desiring a career involving any stage in the design or manufacture of integrated circuits.
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